| 000 | 00545nam a2200229Ia 4500 | ||
|---|---|---|---|
| 008 | 240107s9999 xx 000 0 und d | ||
| 020 | _a978-81-8489-029-7 | ||
| 082 | _a621.381 548 GRO | ||
| 082 | _bGRO | ||
| 100 | _aGROUT IAN A | ||
| 245 | 0 | _aINTEGRATED CIRCUIT TEST ENGINEERING | |
| 245 | 0 | _aINTEGRATED CIRCUIT TEST ENGINEERING | |
| 250 | _n1st | ||
| 260 | _aNEW DELHI | ||
| 260 | _bSPRINGER | ||
| 260 | _c2009 | ||
| 300 | _a362 | ||
| 365 | _b595 | ||
| 500 | _aUNDER TEQIP PHASE - II | ||
| 650 | _aELECTRONICS | ||
| 942 | _cREF | ||
| 999 |
_c15134 _d15134 |
||