| 000 | 00689nam a2200253Ia 4500 | ||
|---|---|---|---|
| 008 | 240107s9999 xx 000 0 und d | ||
| 020 | _a8184894295 | ||
| 082 | _a621.397 SAC | ||
| 082 | _bSAC | ||
| 100 | _aSACHDEV MANOJ | ||
| 245 | 0 | _aDEFECT ORIENTED TESTING FOR NANO METRIC CMOS VLSI CIRCUITS | |
| 245 | 0 | _aDEFECT ORIENTED TESTING FOR NANO METRIC CMOS VLSI CIRCUITS | |
| 250 | _n2nd | ||
| 260 | _aNEW DELHI | ||
| 260 | _bSPRINGER | ||
| 260 | _c2010 | ||
| 300 | _a328 | ||
| 365 | _b499 | ||
| 500 | _aUNDER TEQIP PHASE -II | ||
| 650 | _aELECTRONICS | ||
| 650 | _bDEFECT ORIENTED TESTING NANO METRIC CMOS VLSI CIRCUITS | ||
| 700 | _aPINEDA DE GYVEZ JOSE | ||
| 942 | _cREF | ||
| 999 |
_c15059 _d15059 |
||