GROUT IAN A <br/><br/>
INTEGRATED CIRCUIT TEST ENGINEERING INTEGRATED CIRCUIT TEST ENGINEERING 

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 - NEW DELHI  SPRINGER  2009 
 - 362 
<br/><br/> UNDER TEQIP PHASE - II 
<br/><br/><label>ISBN: </label>978-81-8489-029-7 
<br/><br/><label>Subjects--Topical Terms: </label><br/>ELECTRONICS
<br/><br/><label>Dewey Class. No.: </label>621.381 548 GRO  / GRO