TY  - BOOK
AU  - SACHDEV MANOJ
AU  - PINEDA DE GYVEZ JOSE
TI  - DEFECT ORIENTED TESTING FOR NANO METRIC CMOS VLSI CIRCUITS
SN  - 8184894295
U1  - 621.397 SAC 
CY  - NEW DELHI
KW  - ELECTRONICS
KW  - DEFECT ORIENTED TESTING NANO METRIC CMOS VLSI CIRCUITS
N1  - UNDER TEQIP PHASE -II
ER  -